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Workshops & seminars

EY TECHNOLOGY RISK CASE COMPETITION JANUARY 2022

DATE & TIME
Thursday, January 27, 2022 –
Friday, January 28, 2022
10 a.m. – 11:30 a.m.

Registration is closed

COST

This event is free

ORGANIZATION

Student Success Centre

WHERE

Online

eytechnology

Objective: To provide students the opportunity to learn about the type of work technology risk consultants perform through an interactive case competition.

Goals: To identify key IT risks for a mock client, prioritize risks based on impact and risk level, determine and document methods of addressing key risks, and present findings to a panel of EY judges.

Open to: Undergraduate students enrolled in a university located in Ontario, Quebec, or Nova Scotia. Group sign-ups are optional, not mandatory (i.e., individual sign-ups are welcome).

About the Case Competition:
Our purpose is to translate uncertainty into confidence so that performance is accelerated.​ Put your teamwork and problem solving skills to the test in a Technology Risk Case Competition. This case competition is designed to teach you a little bit more about our practice, test your skills and meet our team. In groups of 3-4, you will be asked to come up with a risk-focused solution and present to a panel of EY judges from across the country. The case competition is open to all undergraduate students attending any Eastern/Maritime post-secondary institution. Participants will be contacted with further information about the event closer to the event date. If you have a team, please register individually and request to be paired with one another. If you do not have a team, we can assign you to one.

Program Schedule
Thursday, January 27, 2022

Information Session & Case Release: 10:00 AM - 11:30 AM ET
30 min - Q&A: 4:00 – 4:30 PM ET
Friday, January 28, 2022
Presentations & Feedback (Preliminary + Finals): 10:00 AM - 2:30 PM ET
Networking: 2:30 PM – 3:30 PM ET

Registration begins on January 13, 2022 at 12:00 AM and ends January 24, 2021 at 11:30 PM, or when attendance reaches its maximum.



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