Surface characterization facility
Atomic Force Microscope
Frame for surface imaging with low current STM and PicoForce capabilities.
Imaging Ellipsometer/Brewster Angle Microscope
Set-up for solid or liquid substrates.
Langmuir and Langmuir-Blodgett Film Balances
Coupled to either fluorescence microscope or Imaging Ellipsometer/Brewster angle microscope.
Molecular Force Probe
Used exclusively for force extension curves.
Configuration for fluorescence and polarized light microscopy of liquid and solid surfaces.
Profile Analysis Tensiometer
For dynamic surface tension, surface rheology and contact angle measurements including subphase exchanger and controlled atmosphere/humidity chamber.
Microvolume multiwell plate coupled to either fluorescence microscope or Imaging Ellipsometer/Brewster angle microscope.