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Surface characterization facility

Atomic Force Microscopy — Multimode 8HR with NanoScope

The MultiMode AFM/STM with Contact Mode, Tapping Mode, Peakforce Tapping Technology, and Scanning Tunneling Microscopy (STM) capabilities.

Imaging Ellipsometer / Brewster Angle Microscope

Set-up for solid or liquid substrates.

Langmuir and Langmuir-Blodgett Film Balances

Coupled to either fluorescence microscope or Imaging Ellipsometer/Brewster angle microscope.

Optical microscope

Configuration for fluorescence and polarized light microscopy of liquid and solid surfaces.

Profile Analysis Tensiometer

For dynamic surface tension, surface rheology and contact angle measurements including subphase exchanger and controlled atmosphere/humidity chamber.

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