Concordia University

http://www.concordia.ca/content/concordia/en/research/nanoscience/facilities/surface-characterization.html

Surface characterization facility

 


afm
Atomic Force Microscope

Frame for surface imaging with low current STM and PicoForce capabilities.

ellipsometer
Imaging Ellipsometer/Brewster Angle Microscope

Set-up for solid or liquid substrates.

nima
Langmuir and Langmuir-Blodgett Film Balances

Coupled to either fluorescence microscope or Imaging Ellipsometer/Brewster angle microscope.


mfp
Molecular Force Probe

Used exclusively for force extension curves.

olympus
Optical microscope

Configuration for fluorescence and polarized light microscopy of liquid and solid surfaces.

pat
Profile Analysis Tensiometer

For dynamic surface tension, surface rheology and contact angle measurements including subphase exchanger and controlled atmosphere/humidity chamber.


kibron
Single-channel Tensiometer

Microvolume multiwell plate coupled to either fluorescence microscope or Imaging Ellipsometer/Brewster angle microscope.

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